Перегляд за автором "Sheinkman, M."

Сортувати за: Порядок: Результатів:

  • Khomenkova, L.; Korsunska, N.; Sheinkman, M.; Stara, T. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2007)
    The process of thermal decomposition of SiOx layers prepared by magnetron sputtering is studied with the use of photoluminescence and Auger and SIMS spectroscopies. From these measurements, we obtained the distributions ...
  • Baran, M.; Bulakh, B.; Korsunska, N.; Khomenkova, L.; Yukhymchuk, V.; Sheinkman, M. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2003)
    Si-rich SiO₂ films prepared by r.f. magnetron sputtering and annealed at 1150 °C are investigated by photoluminescence, Raman and EPR methods. It is found that emission spectrum of as-prepared samples contains one broad ...